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Component Test Platform
500,000 - 3,000,000 Per Piece
1 Piece (MOQ)
The CTP10 is a modular measurement platform for efficient testing of high port-count passive components in 24/7 operation. The CTP10 works with one or several T100S-HP lasers to provide swept insertion loss (IL), polarization dependent loss (PDL) and return loss (RL) measurements with unprecedented performance in the industry.Highest specifications at full speedThe CTP10 maintains industry-leading specifications even when used with a laser at 100 nm/s. You no longer have to compromise between speed and measurement accuracy as the CTP10 provides a 70-dB dynamic range in a single scan together with a 1-pm sampling resolution even at 100 nm/s.The CTP10 is the ideal instrument to characterize advanced WDM components with high port-count, such as wavelength selective switches (WSS). It is also particularly well suited for optical testing of photonic integrated circuit (PIC), both in R&D and manufacturing environments.Next-gen platform and modulesThe following modules are available: IL RL OPM2 Insertion loss and return loss module with two optical detectors IL PDL Insertion loss and polarization dependent loss module in C+L telecom bands IL PDL OPM2 Insertion loss and polarization dependent loss module operating across CTP10 spectral range and with two optical detectors SCAN SYNC Optical sampling of swept wavelength lasers OPMx Optical detector module with 2, 4 or 6 detectors FBC & FBC-M Full-band combiner module for broadband swept measurements of IL & RL or IL & PDL, respectively Powerful intuitive GUIThe embedded software offers a powerful and intuitive GUI to graphically configure the test setup, perform measurement and analysis.Key Features Wavelength range:1240-1680 nm Dynamic range: 70 dB in a single sweep IL resolution: 0.1 mdB Up to 50 detectors per platform Wavelength accuracy: ±5 pm Sampling resolution: 1 pm (even at 100 nm/s)
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