RB Metrology Kirti Nagar, Delhi

To protect our products from being damaged during transit/ handling, we use industrial grade packaging materials. Furthermore, we ensure the packs are appealing for marketing purposes. We own a well-constructed storage space that helps in keeping the batch under secured conditions and away from various spoiling factors such as sunlight, water, moisture, dust, rain and others.   Achieve energy-tunable ultra-high resolution 3D imaging at your synchrotron : ZEISS Xradia Synchrotron solutions bring nanoscale X-ray imaging to your synchrotron facility, enabling you to forgo costly and time consuming in-house development. Proprietary X-ray optics and a proven 3D X-ray microscopy platform leverage the ultra-bright, tunable X-ray beams available at modern synchrotron facilities. Achieve fast non-destructive 3D imaging with resolution <30 nm with a variety of contrast modes. The Xradia Synchrotron family includes 3D imaging microscopes coverage a wide energy range from soft to hard X-rays.     Highlights Xradia 800 Synchrotron: Hard X-ray nanotomography : 3D tomographic imaging with X-rays provides detailed volumetric data of internal structures without the need for cutting or sectioning at the region of interest. Operating in the 5-11 keV energy range, Xradia 800 Synchrotron images a wide range of samples including battery and fuel cell electrodes, catalysts, and soft and hard tissue with resolution <30 nm. Xradia 800 Synchrotron is ideally suited for advanced techniques such as XANES spectro-microscopy for 3D chemical mapping and in situ imaging to enable you to study materials under real operating conditions. Xradia 825 Synchrotron: Soft X-ray nanotomography : 3D tomographic imaging in the soft X-ray range, including the water window up to about 2.5 keV, is ideally suited for structural imaging of whole cells and tissue. Cryogenic sample handling enables you to image in a frozen hydrated state, minimizing effects of radiation damage while maintaining the sample as close to its natural state as possible. Further applications include chemical state mapping of both organic and inorganic materials and imaging of magnetic domains.   Xradia 800 Synchrotron: Hard X-ray nanotomography Leverage non-destructive 3D tomographic imaging<30 nm resolution for detailed volumetric data without the need for cutting or sectioning at the region of interest Experience flexibility for advanced techniques and image a wide range of samples in situ to understand the effect of real operating conditions with unparalleled image quality and throughput Map oxidation state in electrochemical devices or catalysts using XANES spectroscopy   Xradia 825 Synchrotron: Soft X-ray nanotomography Use the “water window” energy range to image organic materials in their natural, wet environment with high contrast Image the structure of whole cells and tissue, using the cryogenic sample handling to minimize the effects of radiation damage Correlate to optical fluorescence microscopy for combined imaging of structure and function

We are here to guide our clients with the secure payment procedures. With us, the customers get convenience to pay through both online and offline payment methods We use premium-packaging materials to safeguard our products from mechanical and environmental conditions. For our patrons, we offer customized packaging solutions as well.   Explore at the speed of science : Achieve spatial resolution down to 50 nm with ZEISS Xradia 810 Ultra X-ray microscope, the highest among lab-based X-ray imaging systems. Experience unparalleled performance and flexibility with the non-destructive 3D imaging that plays a vital role in today’s breakthrough research. The innovative Xradia Ultra architecture, with unique X-ray optics adapted from synchrotron technology, features absorption and phase contrast. Now with energy at 5.4 keV you can increase the throughput of your nanoscale imaging by up to a factor of 10. Achieve even better contrast and image quality for medium to low Z samples with the lower energy of Xradia 810 Ultra. Expect to accomplish advanced in situ and 4D capabilities for studying structural evolution over time and under varying conditions. Extend the limits of exploration with 3D X-ray imaging for materials research, life sciences, natural resources, and diverse industrial applications.Highest resolution, even higher contrast, faster : ZEISS solutions deliver the world’s only non-destructive 3D X-ray imaging with resolution down to 50 nm in a laboratory instrument. Along with both absorption and Zernike phase contrast, ZEISS Xradia 810 Ultra employs advanced optics adapted from the synchrotron to deliver industry-best resolution and contrast for your research. This innovative instrument enables breakthrough research by adding a critical, non-destructive step to your traditional imaging workflow.By delivering higher contrast for your studies at 5.4 keV, Xradia 810 Ultra makes high-resolution X-ray imaging viable for a variety of difficult-to-image materials. Optimize your imaging with absorption and phase contrast for a diverse range of materials such as polymers, oxides, composites, fuel cells, geological samples and biological materials. Having pioneered nanoscale X-ray imaging at synchrotrons and prominent lab facilities worldwide, ZEISS XRM deliver ground¬breaking solutions to help put your studies at the forefront of research.By making nanoscale X-ray imaging an order of magnitude faster, Xradia 810 Ultra optimizes the business case for XRM, whether your work is for science or industry. For central microscopy labs, a faster workflow translates into the ability to allow more users to leverage the instrument in less time, which in turn extends XRM to a broader base of subscribers. Similarly, you can quickly perform and repeat 4D and in situ studies of internal structures, making these techniques viable for many more applications. And if your applications are very targeted, such as digital rock physics used to explore feasibility of oil and gas extraction, Xradia 810 Ultra delivers measurements you can use to characterize critical parameters such as porosity within a matter of hours.   Benefits : The highest resolution—down to 50 nanometers—3D X-ray imaging available in a laboratory Non-destructive 3D X-ray imaging allows repeated imaging of the same sample to provide you with direct observation of microstructural evolution Both absorption and Zernike phase contrast to image a diverse range of materials—medium to low Z, carbonates to shale, tissue to biomechanisms—faster by a factor of 10 at the nanoscale Synchrotron-like results in your lab without the researcher’s challenge of limited access to synchrotrons, or for making your synchrotron time more efficient Improved economics based on faster image acquisition times to expand the reach of the central microscopy lab to a wider range of researchers Switchable field of view from 16 to 65 µm, as best suited to your imaging needs Maintain high resolution while imaging of samples within in situ devices Automated image alignment for tomographic reconstruction Develop, prepare and test your planned synchrotron experiments in your laboratory to make limited availability of synchrotron beam time more efficient Now with Scout-and-Scan Control System with an easy workflow-based user interface, ideal for the central imaging lab where users may have a wide variety of experience levels   Applications Materials Research - Optimize study and design of functional materials: batteries, fuel cells, catalysts, composites, construction materials. Obtain realistic 3D microstructure data to improve computational models for bottom-up design of materials. Study and predict material properties and nanostructural evolution. Examine materials for porosity, cracks, and phase distribution in hours rather than days. Use 3D mapping for deeper understanding of properties and behaviors: porosity/pore connectivity, fiber orientation, crack propagation, particle size/distribution, delamination. High resolution, non-destructive imaging facilitates 4D and in situ studies, with high contrast for medium to low Z materials. Raw Materials - Use nanoscale X-ray microscopy to determine structure of unconventional reservoir rock (carbonate, shale), obtaining parameters for characterization within hours (porosity, permeability) used in flow simulations to optimize extraction. Achieve nanoscale pore structure measurements faster by a factor of 10 for digital rock physics and special core analysis, significantly reducing time to results. Understand geomechanics under load, study the effects of tensile pressure on metals, or analyze ceramics under pressure. Life Sciences - Image soft and hard tissue: microtubules in dentin, osteocyte lacunae and canaliculi in bone, bioscaffolds for tissue engineering, nanoparticle agglomerations in organic materials. Electronics - Optimize your package development process through nanoscale visualization of semiconductor samples for electronics packaging research and development. Understand nanostructural changes in 3D under load : ZEISS Xradia Ultra Load Stage uniquely enables in situ nanomechanical testing - compression, tension, indentation - with non-destructive 3D imaging. Study the evolution of interior structures in 3D, under load, down to 50 nm resolution. Understand how deformation events and failure relate to local nanoscale features. Complement existing mechanical testing methods to gain insight into behavior across multiple length scales.   Highlights Add in situ nanomechanical testing capabilities to your Xradia Ultra nanoscale 3D X-ray microscope (XRM) Acquire 3D tomograms of your sample under load with resolution down to 50 nm Perform a variety of nanomechanical tests such as compression, tension, and indentation Study a wide range of materials including metals, ceramics, composites, polymers and biomaterials Complement your mechanical test results from electron microscopy, microCT and stand-alone test set-ups to understand behavior across multiple length scales: from the atomic level and the nanoscale to the micro and macro scale. Available in two models with different force measurement: LS108: 0.8 N maximum force LS190: 9 N maximum force Compatible with: ZEISS Xradia 800 Ultra ZEISS Xradia 810 Ultra Xradia UltraXRM-L200 Xradia nanoXCT-200   How it works : ZEISS Xradia Ultra Load Stage can be easily configured by the user. It comprises a piezomechanical actuator with closed loop position control, a strain gauge force sensor and sets of top and bottom anvils that enable the various modes. The sample is mounted between two anvils and a sensor measures the force on the sample as a function of anvil displacement.   Key applications :  In situ nanomechanical testing is relevant for a broad range of applications covering both engineered and natural materials. Examples include: High strength alloys Biomaterials / biomechanics Coatings Building materials Fibers / composites Foams

Our quality analysis wing comprises deft professionals who conduct strict checks for ensuring zero-defect products. For the convenience of the clients, we issue an invoice to them including the details of the sale transaction as well as indicating the quantities, products as well as agreed price. Thus, we maintain transparency in our dealings and payment procedures.   Synchrotron-like performance in the lab : With the ZEISS Xradia 800 Ultra X-ray microscope, achieve spatial resolution down to 50 nm, the highest among lab-based X-ray imaging systems. With non-destructive 3D imaging playing a vital role in today’s breakthrough research, you will experience unparalleled performance in an ultra-high resolution lab-based system. The innovative Xradia Ultra architecture features absorption and phase contrast imaging modes and X-ray energy of 8 keV, using unique optics adapted from the synchrotron. With Xradia 800 Ultra, expect to accomplish unrivaled in situ and 4D capabilities for studying material evolution over time and extend the limits of X-ray imaging used in materials science, life sciences, natural resources, and diverse industrial applications.Highlights With resolution as fine as 50 nm, Xradia 800 Ultra provides you with insight into microscopic structures and processes previously not accessible with conventional lab-based X-ray technology. Operating with 8 keV X-rays provides excellent penetration and contrast for a wide range of materials, enabling you to observe structures and materials in their natural state. ZEISS integrated phase contrast technology employing the Zernike method allows enhanced visibility of grain boundaries and material interfaces when absorption contrast is low, providing you with visibility of ultra- and nano-structures without staining. ZEISS Xradia 800 Ultra delivers reliable internal 3D information otherwise only accessible with destructive methods like cross-sectioning. The large working distance and atmospheric sample environment allow you to perform in situ studies with ease. Benefits Non-destructive 3D X-ray imaging allows repeated imaging of the same sample allowing direct observation of microstructural evolution High resolution down to 50 nm is maintained for imaging of samples within in situ devices Automated image alignment for tomographic reconstruction Switchable field-of-view ranging from 15 to 60 µm Absorption and Zernike phase contrast imaging modes Develop, prepare and test your planned synchrotron experiments in your laboratory to make limited availability of synchrotron beam time more efficient Now with Scout-and-Scan Control System with an easy workflow-based user interface, ideal for the central imaging lab where users may have a wide variety of experience levels Applications Materials Research - For advanced materials development: study and predict material properties and evolution. Characterize 3D structures of composite materials, such as fuel cells, polymers and composites. Measure and identify porosity, cracks, phase distribution etc. Material of different densities may be segmented through the use of absorption-contrast imaging. Raw Materials - Oil & gas drilling feasibility studies: perform virtual core analysis to reduce time to results. Nanoscale pore structure measurements for geological samples can now be conducted in a few hours compared to traditional core analysis. Perform flow modeling on the nanoscale to complement submicron imaging with the Versa microscope. Understand geomechanics under load, study the effects of tensile pressure on metals, or analyze ceramics under pressure. Life Sciences - Xradia 800 Ultra offers the ability to visualize the internal structure of biological specimens, such as bone and soft tissue, with resolution down to 50 nm. It offers superior contrast, nanoscale 3D X-ray imaging for a variety of materials such as polymers for drug delivery, tissue samples, and scaffolds for tissue engineering. Electronics - Xradia 800 Ultra offers visualization of semiconductor samples for electronics packaging research and development. Understand nanostructural changes in 3D under load : ZEISS Xradia Ultra Load Stage uniquely enables in situ nanomechanical testing - compression, tension, indentation - with non-destructive 3D imaging. Study the evolution of interior structures in 3D, under load, down to 50 nm resolution. Understand how deformation events and failure relate to local nanoscale features. Complement existing mechanical testing methods to gain insight into behavior across multiple length scales.   Highlights Add in situ nanomechanical testing capabilities to your Xradia Ultra nanoscale 3D X-ray microscope (XRM) Acquire 3D tomograms of your sample under load with resolution down to 50 nm Perform a variety of nanomechanical tests such as compression, tension, and indentation Study a wide range of materials including metals, ceramics, composites, polymers and biomaterials Complement your mechanical test results from electron microscopy, microCT and stand-alone test set-ups to understand behavior across multiple length scales: from the atomic level and the nanoscale to the micro and macro scale. Available in two models with different force measurement: LS108: 0.8 N maximum force LS190: 9 N maximum force Compatible with: ZEISS Xradia 800 Ultra ZEISS Xradia 810 Ultra Xradia UltraXRM-L200 Xradia nanoXCT-200   How it works : ZEISS Xradia Ultra Load Stage can be easily configured by the user. It comprises a piezomechanical actuator with closed loop position control, a strain gauge force sensor and sets of top and bottom anvils that enable the various modes. The sample is mounted between two anvils and a sensor measures the force on the sample as a function of anvil displacement.   Key applications : In situ nanomechanical testing is relevant for a broad range of applications covering both engineered and natural materials. Examples include: High strength alloys Biomaterials / biomechanics Coatings Building materials Fibers / composites Foams

With ultramodern warehouse and automated warehouse management systems, we carry out excellent supply chain management. This helps us in meeting voluminous requirements. By using quality packing material, we make sure that the products are properly packed and there will be zero damage during transit. Moreover, our packaging experts stringently check the entire lot before making the final dispatch.   With ZEISS Xradia 520 Versa you extend the limits of your exploration : Unlock versatility for your scientific discovery and industrial research with ZEISS Xradia 520 Versa, the most advanced model in the Xradia Versa family. Image non-destructively in 3D with X-rays. Build on industry-best resolution and contrast. Expand the boundaries of non-destructive imaging. Innovative contrast and acquisition techniques free you to seek - and find – what you’ve never seen before.Benefits in Xradia 520 Versa Experience Resolution Beyond Micro-CT - Explore a multitude of lab-based applications, sample types and sizes with ZEISS Xradia 520 Versa. Benefit from extending your research beyond the limits of basic projection-based micro-and nano-CT systems. Achieve images with a spatial resolution of 0.7 µm and minimum achievable voxel of 70 nm. Enhance Your Images with Advanced Contrast Techniques - Get images of challenging samples using advanced contrast capabilities like proprietary enhanced absorption contrast or tunable propagation phase contrast. Characterize Materials in situ and in 4D : Characterize the 3D microstructure of materials nondestructively. Uniquely work in simulated conditions – in situ – or study the evolution of your samples’ properties over time in 4D. The Technology Behind X-ray Optics - Profit from achieving submicron resolution at large working distances, known as Resolution at a Distance (RaaD). Xradia Versa architecture natively uses a two-stage magnification: images are initially enlarged through geometric magnification as they are in conventional micro-CTs. The projected image impinges on a scintillator, which converts X-rays to visible light. Your image is subsequently magnified by an optical objective before reaching the detector. Add the optional flat panel extension (FPX) to your system to further increase its versatility. This combination of detector designs allows you to study a wide range of sample sizes and types efficiently and accurately. Highlights Dual Scan Contrast Visualizer (DSCoVer) - With DSCoVer you take advantage of how X-rays interact with matter based on effective atomic number and density. Probe for features normally indistinguishable in a single scan. Identify, for example, mineralogical differences within rocks and difficult-to-discern materials such as silicon and aluminum. Profit from side-by-side tuning of two distinct tomographies at different imaging and sample conditions. Collect data for dual energy analysis seamlessly and easily with DSCoVer.  High-Aspect Ratio Tomography (HART) - Achieve up to 2x higher throughput or better image quality when imaging flat samples such as semiconductor packages and boards. HART enables you to space variable projections so that you collect fewer projections along the broad side of a flat sample and more along the thin side. 3D data is provided by these closely-spaced long views versus less densely-spaced short views. Automated Filter Changer (AFC) - Image challenging samples even easier now. Use AFC to complement your DSCoVer and profit from more flexibility for your in situ workflows. Tune your X-ray energy spectrum with source filters enabled by AFC that houses a standard range of 12 filters along with space for a dozen additional custom filters for new applications. Select filters easily and record your selection within imaging recipes so filters may be changed without disrupting your work flow. Wide Field Mode (WFM) & Vertical Stitching - Image large samples with an extended lateral field of view or use the standard field of view to achieve higher resolution in a single tomography with the help of WFM. Profit from a bigger lateral field of view: approximately twice as wide as in the standard mode and three times larger for a 3D volume. Using the standard field of view, WFM provides nearly twice the number of voxels. Combine WFM with the existing Vertical Stitching feature and subsequently image large samples that are both wider and taller than the standard field of view usually allows. Accessories Laboratory-based Diffraction Contrast (LabDCT) - Unlock crystallographic information in your lab. Achieve direct visualization of 3D crystallographic grain orientation in a non-destructive tomography environment with the LabDCT advanced imaging module powered with GrainMapper3D software by Xnovo Technology. Diffraction contrast tomography (DCT), previously available only at a limited number of synchrotron X-ray facilities, can become your routine tool for non-destructive 3D grain mapping. Acquire and reconstruct crystallographic information from polycrystalline samples, such as metals and alloys. Combine grain orientation information with microstructural features observed in absorption or phase contrast tomography, e.g. cracks, porosity network, inclusions. Open new possibilities for the characterization of damage, deformation and growth mechanisms related to 3D materials science. Achieve enhanced understanding of the fundamental materials science behind these processes with microscopic imaging features in three dimensions. Flat Panel Extension (FPX) - Image even larger samples with high throughput at ZEISS best-in-class image quality. Enhance imaging flexibility and create workflow efficiencies with FPX for industrial and academic research. Rapidly scout large samples to identify a region of interest (ROI). Zoom to image targeted volumes at high resolution. FPX extends the Scout-and-Zoom workflow of Xradia520 Versa. Image the full field of view of samples beyond a 5 inch diameter, like geological cores or intact smartphones, with higher throughput. Combine FPX with Resolution at a Distance (RaaD) and benefit further from high resolution imaging for a variety of samples. AUTOLOADER - Increase your sample handling efficiency: with the Autoloader you can set-up queues of imaging jobs across a shift or over a weekend. Receive automatic notification of job completion. Achieve precise and repeatable sample measurements. Benefit from flexibly handling diverse sample types in the same queue. Minimize user interaction in you research or industrial laboratory, industrial process development, service laboratory, or university central imaging laboratory. Use Our Super Simple Control System to Create Efficient Workflows : All of the features introduced by the Xradia 520 Versa are seamlessly integrated within the Scout-and-Scan Control System, an efficient workflow environment that allows you to easily scout a region of interest and specify scanning parameters. The easy-to-use system is ideal for a central lab-type setting where your users may have a wide variety of experience levels. The interface maintains the flexibility for which Xradia Versa systems are well-regarded, enabling you to set-up scans even more easily. Scout-and-Scan software also offers recipe-based repeatability, which is especially useful for your in situ and 4D research, and enables you to have greater control and efficiency for future work.   New on Version 11: Automated Vertical Stitching capability sets a new industry standard for imaging tall samples at the push of a button. Combine Wide Field Mode with Vertical Stitching to join separate tomographies into a large seamless image, significantly expanding your field of view for samples that are both wider and taller. New Auto Reference provides you with the ability to move in the Z+ or Z- directions as well as the existing X and Y directions, ideal for imaging high aspect ratio samples such as PC boards. Adaptive Motion Compensation is a new method to compensate for sample drift that may during the course of a tomography, such as with soft samples. The new Reconstructor Scout-and-Scan application pairs with the versatile Automatic Reconstructor to provide added flexibility for data reconstruction. Incorporate color palette and log scaling for better data visualization using the new Enhanced Histogram capability. Dual Scan Contrast Visualizer, DSCoVer, on Xradia 520 Versa has been updated with our newly patented dual energy interface to give you precise segmentation of different material types, or different materials with similar densities, with the improved dual energy interface. Visualization and Analysis Software : ZEISS recommends Dragonfly Pro from Object Research Systems (ORS) - An advanced analysis and visualization software solution for your 3D data acquired by a variety of technologies including X-ray, FIB-SEM, SEM and helium ion microscopy.Formerly Visual SI Advanced, Dragonfly Pro delivers high-definition visualization techniques and industry-leading graphics. Dragonfly Pro supports customization through easy to use Python scripting. Users now have total control of their 3D data post-processing environment and workflows.

Experts' assistance is what makes our packaging reliable and highly durable as well. The packaging material used is certified and experts approved to ensure complete safety. Our payment procedure is not only easy to operate but also guarantee secure transactions. In addition to this, it is featured with multiple options like cash payment, bank account transfer and more.   Versatility even at large working distances - mm to inches from source : Achieve new levels of discovery with ZEISS Xradia 510 Versa 3D X-ray microscopes (XRM), the industry’s premier in situ / 4D solution. Our unique RaaD (resolution at a distance) capability breaks the one micron resolution barrier for samples from mm to cm. Use the instrument's powerful combination of world-leading resolution and contrast with flexible working distances to extend the power of non-destructive imaging in your lab.True Submicron Spatial Resolution at Millimeters to Inches from Source : Maximize the power of X-ray microscopy (XRM) with Xradia 510 Versa for flexible 3D imaging in a wide range of research environments. Xradia 510 Versa achieves better than 0.7 μm true spatial resolution with minimum achievable voxel size below 70 nm. Experience increased versatility for soft or low Z materials with advanced absorption contrast along with innovative phase contrast to overcome the limitations of traditional computed tomography. Achieve performance beyond micro-CT and extend scientific research past the limits of flat-panel systems. Where traditional tomography relies on a single stage of geometric magnification, Xradia Versa instruments feature a unique two-stage process based on synchrotron-caliber optics with a detection system optimized for resolution, contrast and high resolution at large working distances. With breakthrough ZEISS Resolution at a Distance (RaaD), you can accomplish unprecedented lab-based exploration for a diverse array of applications and sample types. Non-destructive X-ray and flexible multilength scale capabilities enable you to image the same sample across a wide range of magnifications. As the industry's premier 4D / in situ solution, with Xradia Versa you can uniquely characterize the microstructure of materials in their native environments as well as to study the evolution of properties over time. The optional Versa In Situ Kit allows you to optimize set-up, makes operation easy and provides a faster time to results, organizing the facilities that support in situ rigs (such as wiring and plumbing) to enable maximum imaging performance and ease of use.Additionally, the Scout-and-Scan control system enables an efficient workflow environment with recipe-based set-up that makes Xradia 510 Versa easy for users with a wide variety of experience levels.Applications Materials Research - Expand your materials research capabilities, whether visualizing cracks in soft composite materials or measuring porosity in steel, all with a single system. Perform in situ studies by imaging under varying conditions such as tensile, compression, gas, oxidation, wetting and temperature variations. You can also image materials that are incompatible with vacuum and charged particle beams. Xradia 510 Versa offers the ability to view into deeply buried microstructures that may be unobservable with 2D surface imaging such as optical microscopy, SEM, and AFM. You have the ability to maintain resolution at a distance for in situ imaging experiments, allowing you to study a wide variety of sample sizes and shapes using various in situ apparatus. Understand the impact of these varying conditions over time with the non-destructive nature of X-ray. Raw Materials - Characterize and quantify pore structure and connectivity, understand porosity and permeability, analyze mineral liberation efforts, and study carbon sequestration effectiveness. Perform in situ multiphase fluid flow studies. Experience the most accurate 3D, submicron characterization of microstructural evolution by studying the effects on materials under varying conditions and in 4D (time). Life Sciences - Leverage high resolution and high contrast to explore unstained and stained hard and soft tissues. Quantify osteocyte properties for bone morphology, map neural networks, study vasculature, and understand development of bio structures. Electronics - Optimize your processes and analyze failures. Use non-destructive submicron imaging of intact packages for defect localization and characterization. Measure buried features in three dimensions. Xradia Versa offer the industry’s highest resolution, non-destructive solution for 3D submicron imaging that complements or replaces physical cross sectioning methods.   Benefits : Xradia Versa architecture uses a two-stage magnification technique to enable you to uniquely achieve resolution at a distance (RaaD). In the first stage, enlarge sample images through geometric magnification as with conventional micro-CT. In the second stage, a scintillator converts X-rays to visible light, which is then optically magnified. Reducing dependence upon geometric magnification enables Xradia Versa instruments to maintain submicron resolution at large working distances. This enables you to study the widest range of sample sizes effectively, including within in situ chambers. Additionally, a variety of optional features extend the benefits achieved by the system’s core architecture. Preserve and extend the use of valuable samples with non-destructive 3D imaging Achieve the highest resolution at the largest working distance from the source, a prerequisite for in situ and large sample imaging, with the unique Versa microscope design Multi-length scale imaging of the same sample across a wide range of magnifications, <0.7 µm true spatial resolution and below 70 nm voxel size Industry-leading 4D and in situ capabilities, supporting a wide variety of in situ rigs for submicron imaging of practical sized samples (mm to inches) with weight capability up to 25kg and sample size up to 300mm Unique architecture with dual stage magnification enables easy navigation through multiple magnification detector system, continuous operation through automated multiple point tomography and repetitive scanning, and high speed reconstruction Advanced absorption and phase contrast for low Z materials and soft tissue Scout-and-Scan™ control system for easy-to-use workflow set-up ideal in multi-user environments Minimal need for sample preparation Optional Versa In Situ Kit organizes the facilities that support environmental chambers (such as wiring and plumbing) to enable maximum imaging performance and ease set-up Autoloader option enables you to program and run up to 14 samples at a time to maximize productivity, automate workflows for high volume scanning Use Our Super Simple Control System to Create Efficient Workflows : All of the features on the Xradia 510 Versa are seamlessly integrated within the Scout-and-Scan Control System, an efficient workflow environment that allows you to easily scout a region of interest and specify scanning parameters. The easy-to-use system is ideal for a central lab-type setting where your users may have a wide variety of experience levels. The interface maintains the flexibility for which Xradia Versa systems are known, enabling you to set-up scans even more easily. Scout-and-Scan software also offers recipe-based repeatability, which is especially useful for your in situ and 4D research, and enables you to have greater control and efficiency for future work.   Visualization and Analysis Software  : ZEISS recommends Dragonfly Pro from Object Research Systems (ORS). An advanced analysis and visualization software solution for your 3D data acquired by a variety of technologies including X-ray, FIB-SEM, SEM and helium ion microscopy.Formerly Visual SI Advanced, Dragonfly Pro delivers high-definition visualization techniques and industry-leading graphics. Dragonfly Pro supports customization through easy to use Python scripting. Users now have total control of their 3D data post-processing environment and workflows

By using quality packing material, we make sure that the products are properly packed and there will be zero damage during transit. Moreover, our packaging experts stringently check the entire lot before making the final dispatch. We have streamlined inventory system and spacious warehouse that assist us in meeting the voluminous requirements of the clients and that too in the stipulated time span. With the latest facilities, we efficiently ensure year round availability of the products.   Bridge the Gap in Lab-Based Non-Destructive Submicron Microscopy : Xradia 410 Versa bridges the gap between high-performing X-ray microscopes and less powerful computed tomography (CT) systems. Delivering non-destructive 3D imaging with industry best resolution, contrast, and in situ capabilities, Xradia 410 Versa enables you to achieve groundbreaking research for the widest range of sample sizes. Enhance imaging workflows with this powerful, cost-efficient "workhorse" solution, even in diverse lab environments.Industry-leading 4D and In Situ Capabilities for Flexible Sample Sizes and Types : Xradia 410 Versa X-ray microscope delivers cost-efficient, flexible 3D imaging to enable you to address a wide range of samples and research environments. Non-destructive X-ray imaging preserves and extends the use of your valuable samples over time. The instrument achieves 0.9 μm true spatial resolution with minimum achievable voxel size of 100 nm. Advanced absorption and phase contrast (for soft or low-Z materials) provide you with more versatility to overcome the limitations of traditional computed tomography (CT) approaches. Xradia Versa solutions extend scientific research beyond the limits of projection-based micro- and nano-CT systems. Where traditional tomography relies on a single stage of geometric magnification, Xradia 410 Versa features a unique two-stage process based on synchrotron-caliber optics. It is easy to use, with flexible contrast. Breakthrough Resolution at a Distance (RaaD) enables you to maintain submicron resolution across a broad spectrum of sample dimensions in native environments and within a wide range of in situ rigs. Non-destructive multi-length scale capabilities allow you to image the same sample across a wide range of magnifications, making it possible to uniquely characterize the evolution of material microstructure properties between sequential treatments (4D) or as they are subjected to simulated environmental conditions (in situ).Additionally, the Scout-and-Scan control system enables an efficient workflow environment with recipe-based set-up that makes Xradia 410 Versa easy for users with a wide variety of experience levels.Benefits : Xradia Versa architecture uses a two-stage magnification technique to enable you to uniquely achieve resolution at a distance (RaaD). Enlarge sample images through geometric magnification as with conventional micro-CT. In the second stage, a scintillator converts X-rays to visible light, which is then optically magnified. Reducing dependence upon geometric magnification enables Xradia Versa instruments to maintain submicron resolution at large working distances. This enables you to study the widest range of sample sizes effectively, including within in situ chambers. Non-destructive 3D imaging to preserve and extend the use of valuable samples High spatial resolution down to <0.9 µm and voxel size to 100 nm Advanced contrast solutions for low Z materials and soft tissue Industry-leading 4D and in situ capabilities for flexible sample sizes and types Scout-and-Scan™ control system for easy-to-use workflow set-up, ideal in multi-user environments Heavy load sample stage and extended source and detector stage travel Minimal need for sample preparation Easy navigation through multiple magnification detector system Continuous operation through automated multiple point tomography and repetitive scanning High speed reconstruction Optional Versa In Situ Kit organizes the facilities that support environmental chambers (such as wiring and plumbing) to enable maximum imaging performance and ease set-up while delivering the highest 3D resolution for in situ applications Autoloader option enables you to program and run up to 14 samples at a time to maximize productivity, automate workflows for high volume scanning Applications Materials Research - Image and quantify microstructure evolution in 3D and 4D (time-based). RaaD enables resolution to be maintained for imaging within in situ rigs, including sub-interior regions of your samples, across a large variety of material types and sizes. Raw Materials - Characterize and quantify porosity and micro rock structures to achieve the most accurate 3D submicron characterization of rock pore network for “digital rock” simulations and in situ multiphase fluid flow studies. Use X-ray vision to understand crack propagation in ceramics, metals and building materials. Perform quantitative, high resolution, three-dimensional microstructural analysis of relatively large samples at high resolution in situ. Life Sciences - Characterize specimens in high definition for developmental biology, virtual histology and neural network mapping. High contrast detectors coupled with phase contrast imaging deliver unprecedented cellular-level detail. Electronics - Image failures and microstructural detail in 3D, navigate to a location anywhere within intact sample, perform non-destructive virtual cross sections on large boards and advanced 3D packages. Xradia Versa offer the industry’s highest resolution, non-destructive solution for 3D submicron imaging that complements or replaces physical cross sectioning methods.  Use Our Super Simple Control System to Create Efficient Workflows : All of the features on the Xradia 410 Versa are seamlessly integrated within the Scout-and-Scan Control System, an efficient workflow environment that allows you to easily scout a region of interest and specify scanning parameters. The easy-to-use system is ideal for a central lab-type setting where your users may have a wide variety of experience levels. The interface maintains the flexibility for which Xradia Versa systems are known, enabling you to set-up scans even more easily. Scout-and-Scan software also offers recipe-based repeatability, which is especially useful for your in situ and 4D research, and enables you to have greater control and efficiency for future work. New on Version 11: Automated Vertical Stitching capability sets a new industry standard for imaging tall samples at the push of a button. Combine Wide Field Mode with Vertical Stitching to join separate tomographies into a large seamless image, significantly expanding your field of view for samples that are both wider and taller. New Auto Reference provides you with the ability to move in the Z+ or Z- directions as well as the existing X and Y directions, ideal for imaging high aspect ratio samples such as PC boards. Adaptive Motion Compensation is a new method to compensate for sample drift that may during the course of a tomography, such as with soft samples. The new Reconstructor Scout-and-Scan application pairs with the versatile Automatic Reconstructor to provide added flexibility for data reconstruction. The new Enhanced Histogram capability allows you to incorporate color palette and log scaling for better data visualization . Visualization and Analysis Software : ZEISS recommends Dragonfly Pro from Object Research Systems (ORS). An advanced analysis and visualization software solution for your 3D data acquired by a variety of technologies including X-ray, FIB-SEM, SEM and helium ion microscopy.Formerly Visual SI Advanced, Dragonfly Pro delivers high-definition visualization techniques and industry-leading graphics. Dragonfly Pro supports customization through easy to use Python scripting. Users now have total control of their 3D data post-processing environment and workflows.

We work in close coordination with the team members and packaging professionals; they ensure that the products are packed sternly using the finest quality packaging materials. Ours is the noted name involved in providing excellent support in transaction ensuring complete security of the payment. We undertake both online and offline payment processing methods.   Innovative mechanical design : ZEISS XENOS impresses with its new mechanical design based on the proven ZEISS CenterMax. Unlike the standard bridge-type design, the Y guideways are on top of the side walls which separate all moving axes from the clamping area. Because only the cross beam moves in the Y direction, there are lower moving masses. This remains constant at all times – a real benefit compared to a moving table. Together, the weight reduction and constantly moving masses enable optimal coordination of the drives regarding acceleration and maximum speed.Linear drives in all axes : ZEISS XENOS uses linear drives on all axes. The benefits: high speeds, very fast acceleration, high positioning accuracy and shear force-free drives. In conjunction with the highresolution scales, the use of linear drives on ZEISS XENOS provide very high path adherence and extremely high positioning accuracy below 100 nanometers. For example, the stylus deflection remains more constant, which results in higher accuracy. Another benefit is evident when measuring curved surfaces: the more reliably and accurately a stylus follows the specified path, the more precisely errors can be determined.Virtual central drive : XENOS from ZEISS features two linear drives in the Y direction, which are synchronized via a new technology developed by ZEISS: the central drive. It ensures optimal force distribution of the drives depending on the position of the X axis. This is enabled by the latest generation of controller and algorithm. It is a key element of maximum accuracy and the best possible path adherence throughout the measuring range.Silicon-carbide ceramic : ZEISS XENOS uses an innovative silicon-carbide ceramic for the parts of the machine structure relevant to accuracy. Until now, this material has rarely been used for a comparable part size or accuracy. Compared to the standard aluminum-oxide ceramic, silicon-carbide ceramic exhibits around 50 percent lower thermal expansion, up to 30 percent higher rigidity and 20 percent less weight. Compared to steel, it delivers twice the rigidity at half the weight.Enhanced VAST gold : ZEISS XENOS comes standard with the VAST gold reference probe from ZEISS. During development of ZEISS XENOS, this powerful sensor from ZEISS was further optimized for better accuracy and repeatability. The more rigid connection to the ram on ZEISS XENOS is also new. The VAST gold sensor is designed for styli up to 800 millimeters long and stylus weights up to 500 grams, including asymmetrical stylus configurations.Optimized air bearings : New air bearings with an even more rigid connection enhance stability and and therefore enable better accuracy.Improved electronics design : The influence on precision of moving cables on all coordinate measuring machines has been clearly reduced through the improved decoupling and a new electronics concept featuring decentralized modules. New Computer-Aided Accuracy (CAA) acceptance methods and additional CAA corrections are playing an increasingly vital role in achieving maximum accuracy.Available Software CALYPSO GEAR PRO

We make use of the quality basic material in the production of the entire range. The material is thoroughly checked by our quality experts before procurement from vendors. With the aid of modern packaging system and deft professionals, we can guarantee safe and secure deliveries of products. Also, we make sure that the material used for wrapping them is of premium quality.

We use premium-packaging materials to safeguard our products from mechanical and environmental conditions. For our patrons, we offer customized packaging solutions as well. We promise to deliver the orders within the postulated time frame as we are backed by excellent logistics facility.   Details Carl Zeiss RDS-C5 articulating probe holder with our XDT multi-point sensor or Renishaw TP20 touch-trigger. Measure angled features in difficult to reach locations. The articulating probe holder offers +/- 180 degrees of bi-directional rotation and permits indexing steps of 5 degrees reaching 5,184 angular positions for either sensor. SPECTRUM can also be configured with the XDT directly for general prismatic applications. CAA (Computer Aided Accuracy) ensures computer-aided error correction of the dynamic deformations of the machine technology.   Machine technology The granite machine table underscores the sturdy construction of this measuring machine. 4-side air bearings from Carl Zeiss ensure more stability and measuring precision. The controller, software, sensors and additional components are ZEISS products and are optimally matched to each other. The computer-independent standard control panel permits manual control via the joystick at a measuring location away from the computer. Speed during CNC operation is controlled via the overdrive knob.

With our capacious storage facility, urgent and voluminous requirements of the buyers are easily furnished by us. We use premium-packaging materials to safeguard our products from mechanical and environmental conditions. For our patrons, we offer customized packaging solutions as well.   Model versions : ZEISS PRO is available in three models: The flush-floor version allows safe, unobstructed access from all sides. The on-floor version can be placed on an existing foundation. The table model (PRO T) offers the best independence from a foundation because the table itself provides a rigid, stable base.   Advantages of ZEISS PRO are: Trapezoidal stand and horizontal arm for maximum precision and dynamics Collision protection on both sides Flush-floor access to measuring range from all sides Continuous CSC articulating probe holder with high torque and high dynamics Easy access to maintenance-relevant parts Anti-kink protection for sensor carriers, optional ZEISS EagleEye optical sensor for significantly shorter measuring time   These premium options can be added to the ZEISS PRO advance as required: Full enclosure to protect against dirt and for thermal insulation Temperature compensation for greater accuracy in the event of variations in temperature “Performance option” for 50% greater maximum acceleration “High accuracy” option for approximately 30% less measuring error (in combination with full enclosure and temperature compensation)   ZEISS PRO premium : The ZEISS PRO premium bundles all the performance features that are available for the PRO series in one package. Full enclosure, automatic temperature compensation and the best possible accuracy and speed are indispensable components of the ZEISS PRO premium. A ZEISS PRO advance with all the premium options is identical to a ZEISS PRO premium   Other options and accessories Anti-kink protection for the articulating probe holder Wireless control panel Mobile control unit with TFT monitor, keyboard, trackball and control panel holder for programming directly at the measuring point ZEISS EagleEye optical sensor system Available Software CALIGO HOLOS Available Sensors CSC EagleEye

With our customized packaging solutions, buyers can get packages made according to their specific requirements. Furthermore, they can rest assured the packaging is industrial grade. For safe assembling of all the products, we have invested our time and money in the capacious storage unit that helps us in keeping the products safe till final delivery to the clients.   Turbo scanning : VAST - ZEISS PRISMO enables high-speed with maximum precision. navigator technology is the logical enhancement to scanning from ZEISS. It automatically configures the maximum measuring speed during scanning – with guaranteed accuracy. Additional time is saved through tangential approach and scanning, helix scanning and fast dynamic stylus calibration.Computer-Aided accuracy (CAA) : ZEISS PRISMO uses computerguided corrections of all dynamic influences on the machine. This optimizes precision during high-speed scanning.Measuring near production : ZEISS PRISMO is also ready for environments near production, thus eliminating a trip to the measuring lab. All machine parts critical to operations are perfectly matched. This is achieved through the use of in-house developments for all critical components.Machine technology Bridge made of carbon-fiber compounds and ceramic for minimal weight and high flexural strength Temperature-neutral, glass ceramic scales All axes with air bearings from ZEISS on four sides. X axis: 8 air bearings; Y axis: 8 air bearings; Z axis: 5 air bearings Elastomer vibration damping, as well as covered guideways and scales for use near productionWorkpiece weights up to 5,000 kgZEISS PRISMO ultra : ZEISS PRISMO ultra further increases the accuracy of ZEISS PRISMO. This precision is achieved through more accurate scales, a modified air bearing connection, air damping and stricter matching of all machine parts. ZEISS PRISMO ultra is therefore ideal for jobs in research, development and quality assurance, as well as for the calibration of gages and test pieces.Multi application sensor system : ZEISS PRISMO comes standard with the multi application sensor system (mass) from ZEISS. mass enables both contact and optical measuring on the same machine. Sensors can be changed out in just a few steps thanks to the common interface for all sensors.Options : RT-AB rotary table : Rotary tables are an ideal addition to coordinate measuring machines - particularly for rotationally symmetric parts such as shafts, bearing rings, gear wheels and housings. The RT-AB sits on air bearings and impresses with its seemingly effortless movements, its fantastic radial and axial runout values, and the dynamism of its direct drive. The RT-AB is available as an integrated or retrofitted system and allows you to configure the maximum speed depending on the load. The CAA-corrected positioning accuracy ensures maximum precision. RDS-CAA select : Ensures shorter calibration times for measurements with the RDS articulating probe holder as only a few angular settings require calibration. Additional options Multisensor rack Integration of a rotary table as the 4th axis Use of palletizing and loading systems Accept enclosure for operation near production   Available Sensors LineScan RDS VAST gold VAST XTR gold VAST XXT ViScan

By making use of premium packaging material, we can guarantee zero damage during transit. Moreover, our packaging experts stringently check the entire lot prior to final dispatch. Our organization is highly concerned towards providing excellent quality products to the customers and thus check them at all stages.   Reliably measure at the push of a button : Thanks to fully automatic setting of both illumination and focus, measuring errors due to operator influence are eliminated. At the mere push of a button, ZEISS O-SELECT evaluates the characteristics and documents the results – also in a professional report if needed.The intelligent ZEISS O-SELECT digital measuring projector : In production environments, optical and contact coordinate measuring machines are increasingly replacing manual equipment such as goniometers, gauges and profile projectors. However, the influence of the operator with these manual tools must not be disregarded. With O-SELECT, ZEISS is reducing this influence to a minimum. Thanks to its high level of automation and ease of use, complex measurements can be completed quickly, traceably and reproducibly.Serial measurement at the press of a buttonParts for which a measuring plan has already been generated can be tested with ZEISS O-SELECT at the press of a button. The system identifies the positioned part and loads the appropriate program automatically. The alignment is also automatic. ZEISS O-SELECT sets the optimal illumination and focuses automatically. This not only lightens the operator's workload, but also makes the measurement operator-independent and reproducible. If required, the reliable result is automatically output or printed in a report.Fields of application : Whether it is used in the automotive, electronics or plastics processing industries, ZEISS O-SELECT provides precisely the simplicity and reliability needed in today's industrial environment. The digital measuring projector is particularly suitable for checking the dimensional accuracy of distances, radii or angles. Common test parts include punched and bending parts, or injection-molded and laser-cut workpieces. Features Automatically focused - Incorrect focusing may lead to measuring errors of several micrometers. In manual focusing an error is easily made, unnoticed by the operator. To eliminate this source of error, ZEISS O-SELECT automatically identifies the characteristics to be tested and sets the focal plane accordingly. In other words, operator errors are eliminated. Automatically the best light - Optical measurement can only succeed if the illumination is right. To ensure that each characteristic is seen in the best possible light, ZEISS O-SELECT offers a variable illumination system. The illumination is set automatically to each characteristic, ruling out any possibility of operator error. ZEISS NEO select software : The ZEISS NEO select combines ZEISS metrology know-how with innovative, simple operation. Serial measurements are performed at the press of the button – regardless of the operator. Single measurements and measurement plans are no problem with ZEISS NEO select software: because it is so easy to understand, offers clear operator guidance and reduces his or her workload. Measure directly in the image : Functions and information currently needed are just a mouse click away. Only what is actually required is displayed. – That is the basic idea behind ZEISS NEO select Software. For most measurements, you will never have to leave the main window. Instead of navigating through sub-menus, you measure directly in the image. The clear graphic and logical structure of the software enhances the simplicity of operation. And: the content of individual windows can be defined on an individual basis.Single measurements with Click & Pick : Even unknown parts for which no measurement plan has been generated can be measured quickly, easily and reliably with ZEISS O-SELECT. Using an automatically high-contrast and focused image, ZEISS NEO select software identifies possible features like circles and straight lines.When you move over one of these features with the mouse, you will receive possible characteristics such as radii, distances and angles. With a first Click you define an initial feature, and with a second Pick you select one of the suggested test features – all intuitively, directly on the object.  Measure multiple parts simultaneously : Perform quick multipart measurements with ZEISS NEO select software. Measure identical parts simultaneously at the push of a button. Parts are automatically assigned numbers. After the measurement, all saved "SnapViews" are available for selection, enabling you to see at a glance if the characteristics are within tolerance. Options Easily extend the measuring range - The shifting table can be moved automatically and allows larger components to be measured quickly. The optional measuring field enlargement enables reliable and fast measurements across the entire extended measuring field at the push of a button –and, as usual, in accordance with the ISO standard 10360. Coaxial light - Illumination coaxial to the optics is also available. This is recommended for measuring deep-lying structures which would otherwise be concealed by shadow.

As we have an efficient supply chain network, our company is able to fulfill bulk orders with ease and make deliveries on time. We believe in providing quality-approved products to the clients. For this, we make sure that all the inputs are procured from certified vendors after complete analysis of the quality.   Features telecentric zoomlens Discovery adaptive illumination system scanning sensor VAST XXT probing rack calibration sphere   Options white light distance sensor rotary table loading system with glass pallet and hole grid pallet calibration pallet   Large visual field, high image definition – zoom lens ZEISS Discovery : ZEISS Discovery.V12 comes from the ZEISS Microscopy division. Compared to standard lenses, it provides a 4x larger visual field and very good image definition also in the peripheral zones.     More measured points, more information – scanning sensor ZEISS VAST XXT : With the ZEISS VAST XXT, O-INSPECT is equipped with a flexible, fast and highly precise contact sensor. This scanning sensor captures a considerable number of points in a single pass to enable informative statements on form and location. A speciality in this machine class. ZEISS O-INSPECT allows scans with probing forces in the millinewton range in areas where other multisensor measuring machines only permit single-point measurements with relatively high probing forces. This enables true 3D measurements of thin-walled parts.     Quickly and precisely. Seeing and understanding – with ZEISS CALYPSO : Together with ZEISS CALYPSO, ZEISS O-INSPECT opens up entirely new dimensions of visualization. You see the actual status, nominal display and deviations simultaneously, making it particularly easy to properly allocate and interpret the measuring results.

For the convenience of the clients, we issue an invoice to them including the details of the sale transaction as well as indicating the quantities, products as well as agreed price. Thus, we maintain transparency in our dealings and payment procedures. We are committed towards providing quality-assured products and thus we keep a strict check on the production procedure.   Areas of Application Slewing bearings : Slewing bearings are design and connecting elements used specifically in the construction of wind turbines, cranes, excavators, machines, tunnel boring machines and in mechanical engineering in general. Rotors and turbines : Rotors with a diameter of more than 60 meters anchored on multi-ton mounts – when you think of the size of modern wind turbines, it is easy to forget how much precision is required to ensure that power will be generated reliably for years to come. Gear housing : Gear housing is used to guide all existing waves along the bearing. It ensures that wheels have the necessary variance – no matter how much stress and strain – without impairing their rotary motion and, potentially, their line movement. Gearing : The gear machine element is a circle with teeth spaced evenly over its circumference. Two or more gears paired with each other form a gear drive. They constitute the largest group amongst the gearing mechanisms.

We state our payment terms on the invoice we sent to our clients. Moreover, our payment procedures remain simple and free from any sort of hassles. We offer both online and offline payment processing. As we remain much concerned about the safety of the products, we store the entire lot in our capacious warehousing unit under secured environment and expert's supervision.   Areas of Application Slewing bearings : Slewing bearings are design and connecting elements used specifically in the construction of wind turbines, cranes, excavators, machines, tunnel boring machines and in mechanical engineering in general. Rotors and turbines : Rotors with a diameter of more than 60 meters anchored on multi-ton mounts – when you think of the size of modern wind turbines, it is easy to forget how much precision is required to ensure that power will be generated reliably for years to come. Gear housing : Gear housing is used to guide all existing waves along the bearing. It ensures that wheels have the necessary variance – no matter how much stress and strain – without impairing their rotary motion and, potentially, their line movement. Gearing : The gear machine element is a circle with teeth spaced evenly over its circumference. Two or more gears paired with each other form a gear drive. They constitute the largest group amongst the gearing mechanisms.

We undertake online payment procedures which are completely safe and hassle free. The online transactions are supported by advanced security features. To provide complete satisfaction to the customers, we offer only defect-free range of products that are tested against varied quality parameters.   Areas of Application Slewing bearings : Slewing bearings are design and connecting elements used specifically in the construction of wind turbines, cranes, excavators, machines, tunnel boring machines and in mechanical engineering in general. Rotors and turbines : Rotors with a diameter of more than 60 meters anchored on multi-ton mounts – when you think of the size of modern wind turbines, it is easy to forget how much precision is required to ensure that power will be generated reliably for years to come. Gear housing : Gear housing is used to guide all existing waves along the bearing. It ensures that wheels have the necessary variance – no matter how much stress and strain – without impairing their rotary motion and, potentially, their line movement. Gearing : The gear machine element is a circle with teeth spaced evenly over its circumference. Two or more gears paired with each other form a gear drive. They constitute the largest group amongst the gearing mechanisms.

We are a high-flying name in this arena and thus, strive hard to deliver the best in class products to the clients. Also, we source the basic material from the reliable places. As we have an efficient supply chain network, our company is able to fulfill bulk orders with ease and make deliveries on time.   Areas of Application Slewing bearings : Slewing bearings are design and connecting elements used specifically in the construction of wind turbines, cranes, excavators, machines, tunnel boring machines and in mechanical engineering in general. Rotors and turbines : Rotors with a diameter of more than 60 meters anchored on multi-ton mounts – when you think of the size of modern wind turbines, it is easy to forget how much precision is required to ensure that power will be generated reliably for years to come. Gear housing : Gear housing is used to guide all existing waves along the bearing. It ensures that wheels have the necessary variance – no matter how much stress and strain – without impairing their rotary motion and, potentially, their line movement. Gearing : The gear machine element is a circle with teeth spaced evenly over its circumference. Two or more gears paired with each other form a gear drive. They constitute the largest group amongst the gearing mechanisms.

Owing to our state-of-the-art warehouse, we efficiently entertain both automated inbound and outbound consignments with utmost proficiency. The products are sorted and segregated to make sure that the delivery commences systematically. Reckoned for the offering outstanding array of products, we are headquartered in Delhi(India).   Small and precise : ZEISS MICURA is the solution for new demands in industrial production where parts are becoming increasingly compact and accuracy requirements are rising. Equipped with the VAST XT gold high-end sensor from ZEISS and navigator technology, ZEISS MICURA offers active scanning with measuring accuracy of less than one micrometer. ZEISS MICURA flexes its muscles, in particular, with small, complex parts featuring narrow tolerances such as those used in optics and electronics. Despite its compact size, this system provides a measuring volume of 500 x 500 x 500 millimeters – and therefore considerably more than comparable instruments.Precise high-speed scanning : The VAST XT gold sensor from ZEISS enables high-speed scanning featuring up to 200 measuring points per second. As a result, form and location parameters such as roundness and flatness can be precisely captured, in addition to geometric features, in a short time. The sensor can be equipped with extremely small stylus tips. The smallest stylus has a diameter of just 0.3 millimeters.Automatic measuring speed with VAST navigator from ZEISS : ZEISS MICURA comes standard with VAST navigator technology. It automatically configures the optimal measuring speed with guaranteed accuracy, thus considerably reducing the measuring time. ZEISS MICURA moves somewhat slower in areas that demand more precision. It moves faster with simple contours or when less accuracy is needed. navigator technology also saves time through tangential approach and scanning, helix scanning and fast dynamic stylus calibration.Computer-Aided Accuracy (CAA) : Measuring errors due to dynamically induced inertia effects are automatically compensated for.Operation and ergonomics : ZEISS MICURA comes with a redesigned control panel. One display and two joysticks enable operators to control and program the machine independently of the computer. The system is easy to operate and makes it possible to start measuring even without in-depth experience with measuring machines. The ledge on the front of the granite table allows the control panel and tools to be stored outside the measuring range.Well thought-out design Ceramic guideways and a large bearing base minimize susceptibility to external influences ZEISS air bearings on four sides guarantee stability and precision ZEISS MICURA also comes with a temperature sensor for the workpiece The probing force of the sensor is actively regulated and is very low - ideal for sensitive materials Controller technology, software, sensors and additional components are made by ZEISS and are finely tuned to each other Sample applications Converters and adjusting units with highly accurate leads and bearings Pistons and shafts with the tightest tolerances Artificial hips Gear wheels Optical lens elements    Available Software CALYPSO GEAR PRO

Committed towards satisfying our customers, we are involved in delivering quality Zeiss Metrotom Computed Tomography Machine. The check on quality has been kept by our experts who ensure that the inputs we source are free from any sort of impurities. Thus, we ensure quality products at buyer's end.

We are capable of catering to buyers anywhere in Delhi(India) as well as any other place. We have resources to reach the buyers' Delhi(India) with ease. We keep the finished assortment of products in the highly developed and capacious storage unit. This helps us in keeping the products safe and sorted till the final dispatch.   Coordinate measuring technology for production Three-sided loading and operation Temperature stability from +15ºC to +40ºC Compact dimensions, large measuring space Moveable with a forklift Ram made of temperature-stable carbon-fiber Includes stylus rack with 4 slots Protective enclosure and safety technology   VAST navigator technology package Automatic generation of the ideal measuring strategy Tangential approach Helix scanning Dynamic stylus calibration   VAST performance kit FlyScan QuickChange   Temperature Variable Accuracy (TVA) : The accuracy of measuring machines is usually only given for the ideal temperature. Not with GageMax: thanks to the TVA formula, the accuracy of this system can be exactly determined for different temperatures.   Options Touchscreen – unaffected by oil and dirt Pneumatic stylus rack Illuminated measuring range Rotary table Reliable monitoring of the measuring process - choose one of two following options: Monitoring of the GageMax environment (default) or a protected measuring range (alternative)   Available Software CALYPSO GEAR PRO Available Sensors VAST XT gold VAST XTR gold

Assistance of warehouse management software helps in minimizing the efforts of the personnel and ensures the safe storage of the lot. Moreover, our experts keep a stringent check over the same. We firmly abide with our terms and agreements in regards of Payment and its Time Schedule. Our payment methods are practical and simple. We provide multiple payment options.   Coordinate measuring technology for production Temperature stability from +18ºC to +30ºC No compressed air required Space-saving design Integrated passive damping system Four-sided loading Completely covered guideways   ZEISS VAST XXT scanning sensor Scanning and single-point measuring CNC-guided stylus change 25 mm adapter plate for optimal reproducibility Axial stylus length: 30 to 150 mm Radial stylus length: 30 to 65 mm   Further components Numerical control panel with two progressive joysticks Stylus rack for CNC-guided stylus change   Shop Floor base Dust and moisture protection as per IP54 Carrier arm for keyboard and monitor Lockable storage space for a PC Thermal shielding Movable with lifting truck or forklift   Optional accessories Automatic temperature reader with two workpiece sensors Rotary Table   High Temperature Gradient Deployable from +15ºC to +40ºC Enhanced insulating panels Extreme temperature stability Increased temperature range from +15º C to +40º C   Configuration : In the standard configuration (base, software and ­hardware), DuraMax HTG corresponds to the model with the Shop Floor base.   Available Software CALYPSO GEAR PRO PiWEB Solutions IWC Robert Bosch TRW Automotive Volkswagen

By keeping records of the clients' requirements, we have developed a system that offers several options for transferring money from one end to another. We work with an aim of fulfilling variegated requirements of the clients. And, for this, we have developed a large facility wherein we keep our products.   Key features Robust machine design Ceramic guideways in X and Z provide rigidity and protection against production-related environmental influences Air bearings on all axes for high stability at high travel speeds   Machine technology CONTURA G2 direkt : entry-level scanning technology from Carl Zeiss; equipped with the VAST XXT scanning sensor that can measure a variety of workpieces CONTURA G2 RDS : Scanning of features in all angular positions with VAST XXT on the flexible ZEISS RDS articulating probe CONTURA G2 aktiv : self-centering probing, multi-point measurement of deeper features and reliable measurement of displaced features with size, form and position results also with high throughput thanks to the flexible VAST XT CONTURA G2 navigator for increased productivity and high measuring performance   Options Integrated sensor changer rack for maximum reproducibility without recalibration HTG version for the same accuracy over a larger temperature range Expansion of the Z measuring range by 200 mm with the U-shaped granite table option   Available Sensors RDS VAST XT gold VAST XXT ViScan

Make payment securely with a payment option you are comfortable with. We accept payment through offline as well as online modes. We make sure proper documentation is done. Keeping the quality standards high, we make certain that prior to production, the inputs (raw material) are examined by the professionals to make the final product free from defects.   Sensor variations : ZEISS CONTURA comes with a fixed passive sensor, the flexible RDS articulating probe holder or with an active scanning probe. All sensor variations enable scanning. ZEISS navigator technology comes standard with the active version – for smooth measurements without a stop & go.     Robust and precise : Depending on the configuration, ceramic or CARAT guideways are used on ZEISS CONTURA for high rigidity, low thermal expansion and minimal moving weights. Air bearings in all three axes ensure consistent stability even at high travel speeds and acceleration. The floating glass ceramic scales on ZEISS CONTURA are practically expansionfree and therefore do not require any additional temperature sensors or mathematical compensation. They are suitable for the shop floor and are protected against contamination and other influences.     Computer-Aided Accuracy (CAA) : The bridge is subjected to dynamic forces that can affect accuracy, particularly while scanning. ZEISS CONTURA calculates the compensation for such inertia effects. This ensures that the required precision remains intact even at high measuring speeds.     Convenient control : The system is controlled via a userfriendly control panel and does not need a computer. The progressive joystick enables easier and more precise control of all axis movements. The speed can be regulated in CNC mode.     Options HTG (High Temperature Gradient) for a larger temperature range (18-26°C) with the same measuring uncertainty. Features temperature sensors for the workpiece and measuring machine. Available for x= 700/1,000 mm Integrated sensor rack for maximum reproducibility without recalibration QuickChange fast sensor change-out for active probes ZEISS AirSaver for up to 60% less consumption of compressed air   Sensor variations Direkt : The direkt sensor model is ideal for the measurement of small parts with perpendicular geometries without inclined features. Equipped with the ZEISS VAST XXT scanning sensor, ZEISS CONTURA direkt provides a particularly affordable means of entering the world of scanning technology from ZEISS for production and progress inspection of single processing stages. The alternative XDT single-point sensorcan be retrofitted on VAST XXT from ZEISS as needed. ZEISS CONTURA direkt is available up to a size of 10/16/6. RDS : Combined with the VAST XXT sensor from ZEISS, the flexible, RDS articulating probe holder enables the scanning of features in all angular positions. With a total of 20,736 positions at 2.5° increments, RDS can reach virtually any spatial angle. This is particularly advantageous for the measurement of complex parts, for which specific stylus configurations have to be created. Calibration times are kept to a minimum thanks to optimal calibration routines. RDS also enables the use of optical sensors from ZEISS on ZEISS CONTURA. Aktiv : ZEISS CONTURA aktiv comes standard with navigator technology for fast scanning in one smooth run. It can be operated with the VAST XTR gold or VAST XT gold active scanning probes from ZEISS – and is particularly wellsuited for the measurement of deep and offset features with high throughput rates. Both sensors use the same receptacle. Existing measuring programs can be used following conversion. The QuickChange fast stylus change-out system is also an option.   Available Software CALYPSO GEAR PRO Available Sensors LineScan RDS VAST XT gold VAST XTR gold VAST XXT ViScan

For the convenience of the clients, we issue an invoice to them including the details of the sale transaction as well as indicating the quantities, products as well as agreed price. Thus, we maintain transparency in our dealings and payment procedures. We are capable of delivering consistent and qualitative results by carrying out strict quality examinations.   Achieve optimal measurement results quickly and easily : In just a few simple steps and without any lengthy preparation, the ZEISS COMET LÆ�D 2 sensor is ready for use - enabling you to concentrate on measuring. This comprehensive solution uses the latest sensor technology and the project-oriented software colin3D for data capture and data processing. It affords you a high level of efficiency in operating sequences and generates high-quality measurement data. Thanks to the minimal working distance, it is possible to work in cramped conditions without any difficulty.Designed for mobile and flexible use : Do you value flexible application possibilities? The innovative sensor system is extremely compact and light, meaning you can transport it to different application sites without any difficulty. Simple on-site calibration ensures that you can quickly change the measuring field by swapping the lenses. It’s fast and easy, and soon the system is ready for the next measuring task.High precision for demanding applications : The ZEISS COMET LÆ�D 2 delivers excellent data quality and highly accurate measuring results, making the system the ideal solution for demanding applications in quality inspection. With the colin3D software, you’ll generate easy false color comparisons for individual analysis as well as reports for documenting measuring results.A vast range of applications Quality control / inspection Mold and model making Design Rapid Manufacturing Reverse Engineering Archaeology, documentation of art-historical objects, etc. Innovative technology : With the high light intensity and fast camera on the ZEISS COMET LED 2 sensor, you have the flexibility you need when using it at different sites. The system delivers precise 3D data and automatically recognizes changes in vibration and exposure, even in difficult ambient conditions - high-end technology for exceptional data quality with maximum ease of use. Moreover, the enormous light yield and the sensationally high measuring speed ensure reliable data capture on different object surfaces.