Test Probes Dealers

We offer test finger probe. Reference standard: means of a test probe that is similar to test probe b of iec 61032 but having a circular stop face with a diameter of 125 mm instead of the non-circular face, the distance between the tip of the test finger and the stop face being 100 mm. nodular finger lengh: 100mm (303040mm) dam-board diameter: 125mm.

Magworld is a leading Manufacturer, Supplier and Exporter of varied range of NDT products, having a wide national and global business network with the objective of providing NDT Products & Services with the level of quality, reliability and integrity demanded by various industries that rely on Non Destructive Testing methods. We are located in Hyderabad, Telanagana.

We are offering different types of probes are available for nerve root, murphy ball tip probes and foraminal ball tip probe. They are manufactured with a smooth finish for easy finish and glide. The slight matted finish also prevents glare thus serving easy overall procedure during surgery.

The NFT (Near Field Testing) Probe is designed for high-precision surface inspections using electromagnetic fields. These probes are primarily used for detecting surface-breaking defects such as cracks, corrosion, or delaminations in conductive materials. The Near Field Testing method is particularly beneficial for applications requiring highly sensitive surface defect detection without requiring direct contact with the material.NFT probes are compact, lightweight, and easy to use, making them perfect for a wide range of industrial applications, such as automotive, aerospace, and manufacturing. By using low-frequency electromagnetic fields, these probes are able to detect defects on or near the surface of metals and other conductive materials, making them a vital tool in non-destructive testing (NDT).Key Benefits:Highly sensitive to surface-breaking defects.Fast inspection, ideal for routine maintenance and quality control.Lightweight and portable, easy to use in confined spaces. 

Unjointed Finger Probe   This Probe is made for forceful insertion where the flexibility of the Jointed Finger Probe would be an obstruction. The handle is designed with a threaded hole for use with force gauges. To verify protection of persons against access to hazardous  live parts of hazardous mechanical parts, these are used.   Ball Accessibility Probe with Handle   The 50 mm. Impact Ball with Handle is used to test as per IEC 60529 Standard for protection against access to hazardous parts. Ball is made of chrome-plated hardened steel, and the rest is made of polyamide. It is for impact and access testing.   Test Pin Probe, 15 mm. Long   The Test Pin Probe is used to test for accessibility of small objects and meets IEC, CSA and UL requirements. The probe is made of stainless steel with an insulated handle as per IEC 60950 and 61032 Standards.   Test Rod Probes   The ball on all models is 35mm in diameter. All probe gauges are used for measuring the protection against access to hazardous parts. The rod is made of stainless steel and the stop face and handle are made of plolyamide. Handles are threaded to accept a force gauge.   Unregulated Power Source An Unregulated power source with current limiting circuit, Digital Voltmeter and fault indicator to be used with few test probes as per the standards test requirements

We are Maharashtra based Manufacturer and Supplier of a wide range of Hardness Testing Probes. Our Hardness Testing Probes are made using material that ensures their long life. The Hardness Testing Probes, which we make available, are easy to work with. Our wide array of Hardness Testing Probes embraces C Probe, D + 15 Probe, D Probe, DC Probe and G Probe. Highlights : Sleek designSmooth finishEasy to work withCompetitive rates